| Ag/SiO2复合薄膜的紫外光还原制备及其光学性能 |
| Ag/SiO2 Composite Thin Films: Preparation by UV Radiation Deoxidation and Optical Properties |
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| 摘要: 采用溶胶凝胶法(sol-gel)制备不同Ag掺杂量的Ag/SiO2复合薄膜，通过紫外辐射技术对薄膜进行了还原处理，采用XRD、SEM、IR、UV-Vis、Raman和荧光光谱(PL)等技术对薄膜样品结构进行了表征和光学性能测试。XRD结果表明，复合薄膜样品中的Ag纳米粒子呈面心立方相，利用谢乐公式计算出金属银的平均晶粒尺寸约为10.2 nm；SEM结果显示，所得Ag/SiO2复合薄膜均匀性良好，薄膜中绝大部分纳米颗粒尺寸较小，薄膜约厚1 μm；UV-Vis结果表明，随着nAg/nSi的增加，Ag纳米粒子在420 nm附近的表面等离子共振吸收峰逐渐增强，并伴有一定的红移；PL谱表明，由于Ag纳米粒子的表面等离子共振，薄膜样品在442 nm处发出强光，并且随着Ag浓度增大，发光强度略有降低，出现蓝移；从Raman光谱可以看出由于Ag纳米颗粒表面局域电磁场增强造成的表面增强的拉曼散射(SERS)。 |
| 关键词: Ag/SiO2 复合薄膜 紫外辐射 光学性能 |
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| Abstract: Ag/SiO2 composite thin films were prepared by sol-gel method and UV radiation deoxydation, and were characterized by XRD, SEM, IR, UV-Vis，PL and Raman spectroscopy. The results of XRD indicate that the sample exhibits a typical face-centered cubic(fcc) silver phase. The results of SEM show that the composite thin films are very homogeneous and the size of Ag and SiO2 is small. The thickness of the films is about 1 μm. The results of the optical absorption spectra show that the intensity of the absorption peaks at 420 nm is increasing with the molar ratio of Ag/Si, and the absorption peaks have some red shift. The PL spectra show that the luminescent intensity at 442 nm is very strong and decreases a little with the increase of nAg/nSi. And some blue shift appears. The results of Raman spectra indicate that the surface enhanced Raman scattering(SERS) appears due to the enhancement of the surface region electromagnetic field of Ag nanoparticles. |
| Keywords: Ag/SiO2 composite thin films UV radiation optical properties |
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| 孙小飞,魏长平,李启源,许 洁.Ag/SiO2复合薄膜的紫外光还原制备及其光学性能[J].无机化学学报,2008,24(11):1895-1899. |
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